Global Wafer Defect Inspection System Market Growth 2025-2031

Global Wafer Defect Inspection System Market Growth 2025-2031

The global Wafer Defect Inspection System market size is predicted to grow from US$ 7494 million in 2025 to US$ 13250 million in 2031; it is expected to grow at a CAGR of 10.0% from 2025 to 2031.

Wafer defect inspection system detects physical defects (foreign substances called particles) and pattern defects on wafers and obtains the position coordinates (X, Y) of the defects. Defects can be divided into random defects and systematic defects.

Random defects are mainly caused by particles that become attached to a wafer surface, so their positions cannot be predicted. The major role of a wafer defect inspection system is to detect defects on a wafer and find out their positions (position coordinates).

On the other hand, systematic defects are caused by the conditions of the mask and exposure process, and will occur in the same position on the circuit pattern of all the dies projected. They occur in locations where the exposure conditions are very difficult and require fine adjustment.

The wafer defect inspection system detects defects by comparing the image of the circuit patterns of the adjacent dies. As a result, systematic defects sometimes cannot be detected using a conventional wafer defect inspection system.

Inspection can be performed on a patterned process wafer or on a bare wafer. Each of these has a different system configuration. Below is an explanation of typical inspection systems; Patterned wafer inspection system and Non-patterned wafer inspection system.

The global key manufacturers of Wafer Defect Inspection System include KLA Corporation, Applied Materials, ASML, Hitachi High-Tech Corporation, Onto Innovation, Camtek, Skyverse Technology, SCREEN Semiconductor Solutions, Lasertec, NEXTIN, etc. In 2023, the global top 10 players had a share approximately 92.0% in terms of revenue.

In Patterned Wafer Defect Inspection Systems segment are dominated by KLA and Applied Materials;

Unpatterned Wafer Inspection Systems are dominated by KLA and Hitachi High-Tech Corporation; e-Beam Wafer Defect Review and Classification Systems are dominated by ASML and Applied Materials.

The global market for semiconductor was estimated at US$ 526.8 billion in the year 2023, is projected to US$ 780.7 billion by 2030. IC Manufacturing is the process used to manufacture semiconductor devices, typically integrated circuits (ICs) such as computer processors, microcontrollers, and memory chips (such as NAND flash and DRAM). According to our research, the global semiconductor manufacturing (wafer fabrication) market is projected to grow from US$ 251.7 billion in 2023 to US$ 506.5 billion by 2030, at a Compound Annual Growth Rate (CAGR) of 40.49% during the forecast period. This will drive rapid growth of global Wafer Defect Inspection System.

LP Information, Inc. (LPI) ' newest research report, the “Wafer Defect Inspection System Industry Forecast” looks at past sales and reviews total world Wafer Defect Inspection System sales in 2024, providing a comprehensive analysis by region and market sector of projected Wafer Defect Inspection System sales for 2025 through 2031. With Wafer Defect Inspection System sales broken down by region, market sector and sub-sector, this report provides a detailed analysis in US$ millions of the world Wafer Defect Inspection System industry.

This Insight Report provides a comprehensive analysis of the global Wafer Defect Inspection System landscape and highlights key trends related to product segmentation, company formation, revenue, and market share, latest development, and M&A activity. This report also analyzes the strategies of leading global companies with a focus on Wafer Defect Inspection System portfolios and capabilities, market entry strategies, market positions, and geographic footprints, to better understand these firms’ unique position in an accelerating global Wafer Defect Inspection System market.

This Insight Report evaluates the key market trends, drivers, and affecting factors shaping the global outlook for Wafer Defect Inspection System and breaks down the forecast by Type, by Application, geography, and market size to highlight emerging pockets of opportunity. With a transparent methodology based on hundreds of bottom-up qualitative and quantitative market inputs, this study forecast offers a highly nuanced view of the current state and future trajectory in the global Wafer Defect Inspection System.

This report presents a comprehensive overview, market shares, and growth opportunities of Wafer Defect Inspection System market by product type, application, key manufacturers and key regions and countries.

Segmentation by Type:
Patterned Wafer Defect Inspection System
Non-patterned Wafer Defect Inspection System
E-beam Wafer Defect Inspection and Classification System
Wafer Macro Defects Detection and Classification
Wafer Inspection System for Advanced Packaging

Segmentation by Application:
300mm Wafer Size
200mm Wafer Size
Others

This report also splits the market by region:
Americas
United States
Canada
Mexico
Brazil
APAC
China
Japan
Korea
Southeast Asia
India
Australia
Europe
Germany
France
UK
Italy
Russia
Middle East & Africa
Egypt
South Africa
Israel
Turkey
GCC Countries

The below companies that are profiled have been selected based on inputs gathered from primary experts and analysing the company's coverage, product portfolio, its market penetration.
KLA Corporation
Applied Materials
Lasertec
Hitachi High-Tech Corporation
ASML
Onto Innovation
Camtek
SCREEN Semiconductor Solutions
Skyverse Technology
Toray Engineering
NEXTIN
Suzhou TZTEK (Muetec)
Microtronic
Bruker
SMEE
Hangzhou Changchuan Technology
Wuhan Jingce Electronic Group
Angkun Vision (Beijing) Technology
Nanotronics
Visiontec Group
Hefei Yuwei Semiconductor Technology
Suzhou Secote (Optima)
DJEL
Jiangsu VPTEK
Ever Red New Technology
Confovis
Zhongdao Optoelectronic
Suzhou Xinshi Technology
RSIC scientific instrument (Shanghai)
Gaoshi Technology (Suzhou)
Unity Semiconductor SAS
JUTZE Intelligence Technology
Chroma ATE Inc
CMIT
Engitist Corporation
HYE Technology
Shuztung Group
Cortex Robotics
Takano
Shanghai Techsense

Key Questions Addressed in this Report

What is the 10-year outlook for the global Wafer Defect Inspection System market?

What factors are driving Wafer Defect Inspection System market growth, globally and by region?

Which technologies are poised for the fastest growth by market and region?

How do Wafer Defect Inspection System market opportunities vary by end market size?

How does Wafer Defect Inspection System break out by Type, by Application?

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