Global Vertical Probe Cards Market Growth 2025-2031

Global Vertical Probe Cards Market Growth 2025-2031

The global Vertical Probe Cards market size is predicted to grow from US$ 788 million in 2025 to US$ 1159 million in 2031; it is expected to grow at a CAGR of 6.6% from 2025 to 2031.

A probe card is an interface between an electronic test system and a semiconductor wafer. Typically the probe card is mechanically docked to a prober and electrically connected to a tester. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the circuits at the wafer level, usually before they are diced and packaged. It consists, normally, of a printed circuit board (PCB) and some form of contact elements, usually metallic, but possibly of other materials as well.

The industry"s leading manufacturers are FormFactor, CHPT and Micronics Japan (MJC), which account for 17.24%, 15.66% and 10.23% of revenue, respectively. By region, the Asia-Pacific region has the highest share of income, reaching 72.16 percent in 2019.

LP Information, Inc. (LPI) ' newest research report, the “Vertical Probe Cards Industry Forecast” looks at past sales and reviews total world Vertical Probe Cards sales in 2024, providing a comprehensive analysis by region and market sector of projected Vertical Probe Cards sales for 2025 through 2031. With Vertical Probe Cards sales broken down by region, market sector and sub-sector, this report provides a detailed analysis in US$ millions of the world Vertical Probe Cards industry.

This Insight Report provides a comprehensive analysis of the global Vertical Probe Cards landscape and highlights key trends related to product segmentation, company formation, revenue, and market share, latest development, and M&A activity. This report also analyzes the strategies of leading global companies with a focus on Vertical Probe Cards portfolios and capabilities, market entry strategies, market positions, and geographic footprints, to better understand these firms’ unique position in an accelerating global Vertical Probe Cards market.

This Insight Report evaluates the key market trends, drivers, and affecting factors shaping the global outlook for Vertical Probe Cards and breaks down the forecast by Type, by Application, geography, and market size to highlight emerging pockets of opportunity. With a transparent methodology based on hundreds of bottom-up qualitative and quantitative market inputs, this study forecast offers a highly nuanced view of the current state and future trajectory in the global Vertical Probe Cards.

This report presents a comprehensive overview, market shares, and growth opportunities of Vertical Probe Cards market by product type, application, key manufacturers and key regions and countries.

Segmentation by Type:
MEMS Vertical Probe Cards
Non-MEMS Vertical Probe Cards

Segmentation by Application:
Foundry and Logic
DRAM
Flash
Parametric
Others (RF or MMW or Radar, etc.)

This report also splits the market by region:
Americas
United States
Canada
Mexico
Brazil
APAC
China
Japan
Korea
Southeast Asia
India
Australia
Europe
Germany
France
UK
Italy
Russia
Middle East & Africa
Egypt
South Africa
Israel
Turkey
GCC Countries

The below companies that are profiled have been selected based on inputs gathered from primary experts and analysing the company's coverage, product portfolio, its market penetration.
FormFactor
CHPT
Micronics Japan (MJC)
MPI Corporation
Japan Electronic Materials (JEM)
Technoprobe S.p.A.
SV Probe
Korea Instrument
TSE
Feinmetall
Will Technology
Synergie Cad Probe
STAr Technologies, Inc.
TIPS Messtechnik GmbH
Probe Test Solutions Limited

Key Questions Addressed in this Report

What is the 10-year outlook for the global Vertical Probe Cards market?

What factors are driving Vertical Probe Cards market growth, globally and by region?

Which technologies are poised for the fastest growth by market and region?

How do Vertical Probe Cards market opportunities vary by end market size?

How does Vertical Probe Cards break out by Type, by Application?