Global SiC Metrology and Inspection Equipment Market Growth 2024-2030

Global SiC Metrology and Inspection Equipment Market Growth 2024-2030

Inspection and metrology are becoming more critical in the silicon carbide (SiC) industry amid a pressing need to find problematic defects in current and future SiC devices. Demand for SiC wafers is growing rapidly and production needs to keep up. Speeding up production can result in higher defect rates without the proper inspection equipment in place during the R&D process, where poor verification of your process tools can dramatically reduce yield.

The global SiC Metrology and Inspection Equipment market size is projected to grow from US$ 1117 million in 2024 to US$ 3607 million in 2030; it is expected to grow at a CAGR of 21.6% from 2024 to 2030.

LP Information, Inc. (LPI) ' newest research report, the “SiC Metrology and Inspection Equipment Industry Forecast” looks at past sales and reviews total world SiC Metrology and Inspection Equipment sales in 2023, providing a comprehensive analysis by region and market sector of projected SiC Metrology and Inspection Equipment sales for 2024 through 2030. With SiC Metrology and Inspection Equipment sales broken down by region, market sector and sub-sector, this report provides a detailed analysis in US$ millions of the world SiC Metrology and Inspection Equipment industry.

This Insight Report provides a comprehensive analysis of the global SiC Metrology and Inspection Equipment landscape and highlights key trends related to product segmentation, company formation, revenue, and market share, latest development, and M&A activity. This report also analyzes the strategies of leading global companies with a focus on SiC Metrology and Inspection Equipment portfolios and capabilities, market entry strategies, market positions, and geographic footprints, to better understand these firms’ unique position in an accelerating global SiC Metrology and Inspection Equipment market.

This Insight Report evaluates the key market trends, drivers, and affecting factors shaping the global outlook for SiC Metrology and Inspection Equipment and breaks down the forecast by Type, by Application, geography, and market size to highlight emerging pockets of opportunity. With a transparent methodology based on hundreds of bottom-up qualitative and quantitative market inputs, this study forecast offers a highly nuanced view of the current state and future trajectory in the global SiC Metrology and Inspection Equipment.

Global key players of SiC Wafer Defect Inspection System include KLA Corporation, Lasertec, Bruker, Visiontec Group, TASMIT, Inc., etc. The top five players hold a share about 95%. North America is the largest market, and has a share about 32%, followed by Europe and Japan with share 27% and 15%, separately. In terms of product type, Optical Inspection System is the largest segment, occupied for a share of 97%. In terms of application, SiC Substrate has a share about 73 percent.

This report presents a comprehensive overview, market shares, and growth opportunities of SiC Metrology and Inspection Equipment market by product type, application, key manufacturers and key regions and countries.

Segmentation by Type:
SiC Defect Inspection Equipment
SiC Metrology Equipment

Segmentation by Application:
SiC Substrate/Wafer
SiC Epitaxial Wafer

This report also splits the market by region:
Americas
United States
Canada
Mexico
Brazil
APAC
China
Japan
Korea
Southeast Asia
India
Australia
Europe
Germany
France
UK
Italy
Russia
Middle East & Africa
Egypt
South Africa
Israel
Turkey
GCC Countries

The below companies that are profiled have been selected based on inputs gathered from primary experts and analysing the company's coverage, product portfolio, its market penetration.
KLA Corporation
Lasertec
Tokyo Electron Ltd. (TEL)
Applied Materials
Hitachi High-Technologies
Onto Innovation
SCREEN
ZEISS
Camtek
Visiontec Group
Nanotronics
TASMIT, Inc. (Toray Engineering)
Bruker
LAZIN CO.,LTD
EtaMax
Angkun Vision (Beijing) Technology
Spirox Corporation
Shenzhen Glint Vision
confovis GmbH
CASI Vision Technology (Luoyang) Co., Ltd
CETC Fenghua Information Equipment
T-Vision.AI (Hangzhou) Tech Co.,Ltd.

Key Questions Addressed in this Report

What is the 10-year outlook for the global SiC Metrology and Inspection Equipment market?

What factors are driving SiC Metrology and Inspection Equipment market growth, globally and by region?

Which technologies are poised for the fastest growth by market and region?

How do SiC Metrology and Inspection Equipment market opportunities vary by end market size?

How does SiC Metrology and Inspection Equipment break out by Type, by Application?



Please note: The report will take approximately 2 business days to prepare and deliver.