Global Metrology and Inspection Equipment for SiC & GaN Market Growth 2024-2030

Global Metrology and Inspection Equipment for SiC & GaN Market Growth 2024-2030

Inspection and metrology are becoming more critical in the silicon carbide (SiC) industry amid a pressing need to find problematic defects in current and future SiC devices. Demand for SiC wafers is growing rapidly and production needs to keep up. Speeding up production can result in higher defect rates without the proper inspection equipment in place during the R&D process, where poor verification of your process tools can dramatically reduce yield.

The global Metrology and Inspection Equipment for SiC & GaN market size is projected to grow from US$ 1313 million in 2024 to US$ 4174 million in 2030; it is expected to grow at a CAGR of 21.3% from 2024 to 2030.

LP Information, Inc. (LPI) ' newest research report, the “Metrology and Inspection Equipment for SiC & GaN Industry Forecast” looks at past sales and reviews total world Metrology and Inspection Equipment for SiC & GaN sales in 2023, providing a comprehensive analysis by region and market sector of projected Metrology and Inspection Equipment for SiC & GaN sales for 2024 through 2030. With Metrology and Inspection Equipment for SiC & GaN sales broken down by region, market sector and sub-sector, this report provides a detailed analysis in US$ millions of the world Metrology and Inspection Equipment for SiC & GaN industry.

This Insight Report provides a comprehensive analysis of the global Metrology and Inspection Equipment for SiC & GaN landscape and highlights key trends related to product segmentation, company formation, revenue, and market share, latest development, and M&A activity. This report also analyzes the strategies of leading global companies with a focus on Metrology and Inspection Equipment for SiC & GaN portfolios and capabilities, market entry strategies, market positions, and geographic footprints, to better understand these firms’ unique position in an accelerating global Metrology and Inspection Equipment for SiC & GaN market.

This Insight Report evaluates the key market trends, drivers, and affecting factors shaping the global outlook for Metrology and Inspection Equipment for SiC & GaN and breaks down the forecast by Type, by Application, geography, and market size to highlight emerging pockets of opportunity. With a transparent methodology based on hundreds of bottom-up qualitative and quantitative market inputs, this study forecast offers a highly nuanced view of the current state and future trajectory in the global Metrology and Inspection Equipment for SiC & GaN.

Global key players of SiC Wafer Defect Inspection System include KLA Corporation, Lasertec, Bruker, Visiontec Group, TASMIT, Inc., etc. The top five players hold a share about 95%. North America is the largest market, and has a share about 32%, followed by Europe and Japan with share 27% and 15%, separately. In terms of product type, Optical Inspection System is the largest segment, occupied for a share of 97%. In terms of application, SiC Substrate has a share about 73 percent.

This report presents a comprehensive overview, market shares, and growth opportunities of Metrology and Inspection Equipment for SiC & GaN market by product type, application, key manufacturers and key regions and countries.

Segmentation by Type:
SiC & GaN Defect Inspection Equipment
SiC & GaN Metrology Equipment

Segmentation by Application:
SiC Wafer/Epitaxial/Device
GaN Wafer/Epitaxial/Device

This report also splits the market by region:
Americas
United States
Canada
Mexico
Brazil
APAC
China
Japan
Korea
Southeast Asia
India
Australia
Europe
Germany
France
UK
Italy
Russia
Middle East & Africa
Egypt
South Africa
Israel
Turkey
GCC Countries

The below companies that are profiled have been selected based on inputs gathered from primary experts and analysing the company's coverage, product portfolio, its market penetration.
KLA Corporation
Lasertec
Tokyo Electron Ltd. (TEL)
Applied Materials
Hitachi High-Technologies
Onto Innovation
SCREEN
ZEISS
Camtek
Visiontec Group
Nanotronics
TASMIT, Inc. (Toray Engineering)
Bruker
LAZIN CO.,LTD
EtaMax
Angkun Vision (Beijing) Technology
Spirox Corporation
Shenzhen Glint Vision
confovis GmbH
CASI Vision Technology (Luoyang) Co., Ltd
CETC Fenghua Information Equipment
T-Vision.AI (Hangzhou) Tech Co.,Ltd.

Key Questions Addressed in this Report

What is the 10-year outlook for the global Metrology and Inspection Equipment for SiC & GaN market?

What factors are driving Metrology and Inspection Equipment for SiC & GaN market growth, globally and by region?

Which technologies are poised for the fastest growth by market and region?

How do Metrology and Inspection Equipment for SiC & GaN market opportunities vary by end market size?

How does Metrology and Inspection Equipment for SiC & GaN break out by Type, by Application?



Please note: The report will take approximately 2 business days to prepare and deliver.